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[null,"Kód","Název","Semestr","Rozsah, examinace","Katedra","Fakulta","4EU+"]
[null,"AP444008","Physics of thin films and surfaces","oba"," 2/1, Jiné [HT]",444,"FCHI","ne"]
[null,"AP444010","Optical and Electron Microscopy","oba"," 3/0, Jiné [HT]",444,"FCHI","ne"]
[null,"M444011","Optická a elektronová mikroskopie","zimní","zimní s.:1/2, KZ [HT]",444,"FCHI","ne"]
[null,"M444014","Metrologie fyzikálních veličin","letní","letní s.:2/3, Z+Zk [HT]",444,"FCHI","ne"]
[null,"P444008","Fyzika tenkých vrstev a povrchů","oba"," 2/1, Jiné [HT]",444,"FCHI","ne"]
[null,"P444010","Optická a elektronová mikroskopie","oba"," 3/0, Jiné [HT]",444,"FCHI","ne"]