Vlček Jan Ing. Ph.D.
Address: |
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Office: |
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Phone: |
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Fax: |
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E-Mail: |
Jan.Vlcek@vscht.cz |
Additional information: |
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Faculty: |
Faculty of Chemical Engineering |
Department: |
Department of Physics and Measurement (444) |
Phone: |
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E-mail: |
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Courses |
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| Code | Title | Semester | Hours per week, examination | Department | Faculty | 4EU+ |
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P444008 |
Physics of thin films and surfaces |
both |
2/1, other [HT] |
444 |
FCHI |
no |
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N402079 |
Laboratory of characterization of nano and microsystems |
winter |
winter s.:0/4, MC [HT] |
402 |
FCHI |
no |
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N444020 |
Measuring and Control Engineering: Laboratory |
summer |
summer s.:0/3, MC [HT] |
444 |
FCHI |
no |
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N409073 |
Laboratory of manufacturing of nano and micromaterials |
winter |
winter s.:0/4, MC [HT] |
409 |
FCHI |
no |
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M444006 |
Measuring Technique |
winter |
winter s.:2/3, Ex [HT] |
444 |
FCHI |
no |
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N444012 |
Metrology |
summer |
summer s.:2/3, C+Ex [HT] |
444 |
FCHI |
no |
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M444014 |
Metrology of Physical Quantities |
summer |
summer s.:2/3, C+Ex [HT] |
444 |
FCHI |
no |
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AP444010 |
Optical and Electron Microscopy |
both |
3/0, other [HT] |
444 |
FCHI |
no |
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M444011 |
Optical and Electron Microscopy |
winter |
winter s.:1/2, MC [HT] |
444 |
FCHI |
no |
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P444010 |
Optical and Electron Microscopy |
both |
3/0, other [HT] |
444 |
FCHI |
no |
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AP444008 |
Physics of thin films and surfaces |
both |
2/1, other [HT] |
444 |
FCHI |
no |
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M444013 |
Technology and Properties of Sensing Layers |
winter |
winter s.:3/1, C+Ex [HT] |
444 |
FCHI |
no |
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N444028 |
Technology of Thin Layers and Sensors |
winter |
winter s.:3/1, C+Ex [HT] |
444 |
FCHI |
no |
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