Spectroscopical Methods for Study of Solids - AP107002
Title: Spectroscopical Methods for Study of Solids
Guaranteed by: Department of Glass and Ceramics (107)
Faculty: Faculty of Chemical Technology
Actual: from 2019
Semester: both
Points: 0
E-Credits: 0
Examination process:
Hours per week, examination: 3/0, other [HT]
Capacity: winter:unknown / unknown (unknown)
summer:unknown / unknown (unknown)
Min. number of students: unlimited
State of the course: taught
Language: English
Teaching methods: full-time
Teaching methods: full-time
Note: course is intended for doctoral students only
can be fulfilled in the future
you can enroll for the course in winter and in summer semester
Guarantor: Gedeon Ondrej prof. RNDr. Ph.D., DSc.
Interchangeability : P107002
Examination dates   Schedule   
Annotation -
The course covers X-ray, electron, and ion spectroscopies, electron and tip microscopies, and detectors and analysers. The stress is put on principles and theoretical description of fundamental phenomena governing the spectroscopies and microscopies.
Last update: Pátková Vlasta (19.11.2018)
Aim of the course -

Students will be able to:

describe and explain physical phenomena on which the methods are based,

propose a suitable microscopic or spectroscopic method for extracting of specific information about material,

suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation, to optimise measuring conditions.

Last update: Pátková Vlasta (19.11.2018)
Literature -

R: A. Beiser, Concepts of Modern Physics, Mc Graw-Hill, 1975, ISBN 0-07-115096-X

R: Y. Leng, Materials characterization, Wiley, 2008,ISBN 978-0-470-82298-2

R: R.F. Egerton, Physical principles of electron microscopy, Springer, 2006, ISBN-13: 978-0387-25800-0

A: Selected papers and web pages

Last update: Pátková Vlasta (19.11.2018)
Learning resources -
Last update: Pátková Vlasta (19.11.2018)
Teaching methods -

Lectures, tutorials.

Last update: Pátková Vlasta (19.11.2018)
Syllabus -

Spectrum, cross section, properties of particles and radiation. Elastic and inelastic cross section, Compton scattering, Rutherford scattering, photoelectric effect.

Physics of of atom, electron-electron and spin-orbital interactions, splitting of spectral lines. Electron and atom energy levels, selection rules, energy bands in solid, Bloch function, quantum tunnelling.

Transmission electron microscopy, principles, contrast, sample preparations.

Scanning electron microscopy, principles, backscattered and secondary electrons, sample preparations.

Electron microprobe analysis, principle of the method, correction methods.

X-ray fluorescence spectroscopy, principle, correction methods.

Surface - creation, structure and properties. XPS and UV XPS, principles of the methods, satellite lines, angle-resolved spectroscopy.

Auger spectroscopy, principles, Auger microscopy.

SIMS for solids, ion scattering, kinematic factor, sputtering yield, SNMS.

PIXE, RBS and other ion spetroscopies, low energy ion spectroscopy.

Probe microscopies and their principles. STM, AFM, and SNOM.

Diffraction of photons, electrons and neutrons. Structural factor. LEED, EBSD, XRD, and ND.

Vacuum and vacuum instruments. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole mass analyser, time-of-flight analyser.

Last update: Pátková Vlasta (19.11.2018)
Course completion requirements -

Oral exam.

Last update: Pátková Vlasta (19.11.2018)