SubjectsSubjects(version: 901)
Course, academic year 2021/2022
Optical and Electron Microscopy - AP444010
Title: Optical and Electron Microscopy
Guaranteed by: Department of Physics and Measurement (444)
Actual: from 2019
Semester: both
Points: 0
E-Credits: 0
Examination process:
Hours per week, examination: 3/0 other [hours/week]
Capacity: winter:unlimited / unknown (unknown)
summer:unknown / unknown (unknown)
Min. number of students: unlimited
Language: English
Teaching methods: full-time
For type: doctoral
Note: can be fulfilled in the future
you can enroll for the course in winter and in summer semester
Guarantor: Vlček Jan Ing. Ph.D.
Interchangeability : P444010
Last update: Vlček Jan Ing. Ph.D. (28.11.2018)
Aim of the course is to provide theoretical a practical basics and aspects of using an optical and electron microscopes for an effective application during measurement. Students will see the possibilities and restrictions of both microscopy techniques. They will know how to set optimal parameters for obtaining the best results. This course also includes explanations of automated image analysis.
Aim of the course
Last update: Vlček Jan Ing. Ph.D. (28.11.2018)

Students will be able to:

  • explain the basics of electron and photon optics, lenses, lenses errors, interaction of electron with solid state, sample preparation principles – sputtering and evaporation, principles of automated image analysis.

  • prepare a sample for scanning electron microscopy, for transmission electron microscopy.

  • operate with optical and scanning electron microscope.

Last update: Vlček Jan Ing. Ph.D. (30.08.2019)

Z: Jerome Mertz, Introduction to Optical Microscopy, Cambridge University Press, 2019, ISBN: 1108428304

Z: Ludwig Reimer, Helmut Kohl, Transmission Electron Microscopy: Physics of Image Formation, Springer, 2008, ISBN: 0387347585

Z: Ludwig Reimer, Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, Springer, 1998, ISBN: 3540639764

Z: Kubínek R., Šafářová K., Vůjtek M., Elektronová mikroskopie, Univerzita Palackého v Olomouci - skripta, 2011, ISBN: 978-80-244-2739-3

Z: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, R.F. Egerton, Springer Science & Business Media, 2006, ISBN 0387260161, 9780387260167

Z: Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Scanning Electron Microscopy and X-Ray Microanalysis, Springer, 2017, ISBN 1493966766, 9781493966769

Z: David B. Williams, C. Barry Carter, Transmission Electron Microscopy: A Textbook for Materials Science, Springer Science & Business Media, 2009, ISBN 038776500X, 9780387765006

Z: Peter Török, Fu-Jen Kao,Optical Imaging and Microscopy: Techniques and Advanced Systems, Springer, 2013, ISBN 3540460225, 9783540460220

Z: Raymond Haynes, Optical Microscopy of Materials, Springer Science & Business Media, 2013, ISBN 147576085X, 9781475760859

Learning resources
Last update: Vlček Jan Ing. Ph.D. (28.11.2018)

Available at course webpages:

Syllabus -
Last update: Vrňata Martin prof. Dr. Ing. (23.04.2020)

1. Introduction - basic microscopic techniques

2. Limits of microscopic techniques

3. Construction parameters of microscopes - I. Optical

4. Construction parameters of microscopes - II. Confocal

5. Detectors and sources of radiation in microscopy - I.

6. Electron microscopy - interactions of electrons, sources of electrons

7. Vacuum technique for elelctron microscopy

8. Construction parameters of microscopes - III. Electron scanning

9. Detectors and sources of radiation in microscopy - II.

10. EDX and WDX detectors and elemental analysis

11. Accessories for SEM microscopy - focused ion beams, manipulators

12. Preparation of samples for electron microscopy - I.

13. Construction parameters of microscopes - IV. Electron transmission

14. Preparation of samples for electron microscopy - II.

Entry requirements
Last update: Vlček Jan Ing. Ph.D. (28.11.2018)


Registration requirements
Last update: Vlček Jan Ing. Ph.D. (28.11.2018)


Course completion requirements
Last update: Vlček Jan Ing. Ph.D. (28.11.2018)

Oral exam