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The aim of the course is to teach the student to master microscopic techniques at an advanced level and to understand their principles. The subject is suitable for preparing the student for the part of his bachelor's thesis that concerns the characterization of samples. In addition, the knowledge gained in the subject is also suitable for solving tasks from production practice that require the use of microscopy. First of all, it concerns microscopic analyzes of manufacturing defects.
Last update: Macháček Jan (19.02.2024)
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The credit is awarded for attendance. The exam consists of a written and oral part. Last update: Macháček Jan (23.02.2024)
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R: Bartuška M: Technická mineralogie, skripta, VŠCHT Praha, 1987. R: Gregerová M, Fojt B, Vávra B: Mikroskopie horninotvorných a technických minerálů, Morav. zem. muz., PřF MU Brno, 2002.ISBN:80-7028-195-2 A: Mackenzie WS, Guilford C: Atlas of rock-forming minerals in thin section, Longman, 1980.ISBN-10:0470269219,ISBN-13:978-0470269213 A: Raith MM, Raase P, Reinhardt J: Guide to thin section microscopy, 2011.ISBN:978-3-00-033606-5 R: Russ JC: The image processing handbook, CRC Press, 2007. ISBN-10:1439840458,ISBN-13:978-1439840450 A: Wu Q, Merchant F, Castleman KR: Microscope Image Processing, Elsevier, 2008.ISBN-10:012372578X,ISBN-13:978-0123725783 Last update: Macháček Jan (23.02.2024)
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písemná i ústní zkouška Last update: Macháček Jan (19.02.2024)
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1. Basic concepts of optics: light as an electromagnetic wave – index of refraction – reflection and refraction of light – polarization of light – interference of light – diffraction of light – geometrical optics – optical defects. 2. Advanced optics: propagation of light in anisotropic substances - use of birefringent substances - photometry - colorimetry. 3. Classical (light) microscopy – imaging principles – lateral resolution – depth of field – microscope components – microscopy technique – reflection microscopy – specimen preparation – microscope maintenance. 4. Polarization microscopy: imaging principles, parallel polarizers (PPL) – crossed polarizers (XPL) – compensators – conoscopic imaging – reflection microscopy in XPL. 5. Evaluation of optical properties of crystals in polarized light: microstructure and texture - relief - measurement of refractive index - pleochroism. 6. Evaluation of the optical properties of crystals in crossed polarizers: extinction – interference colors and specific birefringence – character of the zone and optical character of the mineral – measurement of stress in the material. 7. Digital microscopy and contrast enhancement: digital microscopy - dynamic range of imaging (HDR) - extended depth of field (EDF) - dark field - phase contrast - differential interference contrast (DIC) - interference microscopy. 8. Confocal microscopy: imaging principles – lateral and axial resolution – microscope components – microscopy technique – height map processing – roughness and waviness parameters – layer thickness measurement – particle size measurement – volume measurements. 9. Special microscopy: fluorescence microscopy – Raman and IR microscopy – microhardness measurement – high temperature microscopy – tomography and 3D scanning. 10. Microscopic image analysis: digital imaging and image processing – image segmentation – methods of mathematical morphology – determination of particle size distribution – stereology – image segmentation using artificial intelligence. 11. Specifics of microscopy of materials: microscopy of raw materials and rocks – ceramic materials – metal materials and biomaterials – polymer materials and fibers – defects in glass and stresses in the material. 12. Scanning electron microscopy in the context of material defect analysis. 13. Elemental analysis in electron microscopy (EDX) and light microscopy (LIBS). 14. Summary of the strategy of microscopic analysis of materials. Last update: Macháček Jan (23.02.2024)
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micro.magnet.fsu.edu/primer www.olympusmicro.com petrol.sci.muni.cz/mikroskopie/uvod.htm www.earth.ox.ac.uk/~oesis/micro webmineral.com Last update: Macháček Jan (23.02.2024)
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prerequisites - none co-requisites - none equivalence - none Last update: Macháček Jan (23.02.2024)
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