Advanced Materials and Their Characterization - P126002
Title: Pokročilé materiály a jejich charakterizace
Guaranteed by: Department of Solid State Engineering (126)
Faculty: Faculty of Chemical Technology
Actual: from 2019
Semester: both
Points: 0
E-Credits: 0
Examination process:
Hours per week, examination: 3/0, other [HT]
Capacity: winter:unknown / unknown (unknown)
summer:unknown / unknown (unknown)
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Teaching methods: full-time
Note: course is intended for doctoral students only
can be fulfilled in the future
you can enroll for the course in winter and in summer semester
Guarantor: Slepička Petr prof. Ing. Ph.D.
Is interchangeable with: AP126002
Examination dates   
Annotation -
The aim of the subject is to introduce students to theory and practical aspects of advanced materials based on semiconductors, dielectrics and other materials with emphasis on a broad discussion focused on special materials' processing techniques, thin film preparation and their applications in electronics and tissue engineering. Students will also be introduced to a number of sophisticated analytical methods that, beyond their basic use, can be used in nanolithography and advanced surface analysis.
Last update: Slepička Petr (27.05.2018)
Aim of the course -

Students will know:

Possibilities of surface activation, modification and techniques for the preparation of thin films on solid substrates, with focus on applications in electronics and tissue engineering.

Theoretical basics in the field of interaction of solids with energy beam (plasma, laser, ion beam) and discussion of this knowledge in connection with applications.

Description of selected analytical methods from the point of view of their use for elemental, morphological and volume analysis, advantages and disadvantages for selected types of materials and applications.

Last update: Slepička Petr (27.05.2018)
Literature -

R: Kasap S.O., Principles of Electronic Materials and Devices, 2003, ISBN: 0-07-239342-4

R: G.L. Hornyak a kol.: Introduction to nanoscience. Chapter 3. Characterization methods. CRC Press, 2008, ISBN 978-4200-4805-6.

A: Waser R.(Ed.): Nanoelectronics and Information Technology, 2005, ISBN-13:978-3-527-40542-8

A: Cao: Nanostructures & Nanomaterials: Synthesis, Properties & Applications, Chapter 8. Characterization and Properties of Nanomaterials, Imperial College Press, London, 2004, ISBN 1-86094-4159

Last update: Slepička Petr (24.09.2018)
Learning resources -

Last update: Slepička Petr (27.05.2018)
Teaching methods -

Lectures, Interactive discussions

Last update: Slepička Petr (27.05.2018)
Syllabus -

1. Structure of materials and possibilities of their surface modification

2. Effect of laser beam, construction of periodic structures and their application

3. Semiconductors and their properties

4. Methods of preparation of semiconductor materials and their modification

5. Thin layers and their advanced applications I

6. Thin layers and their advanced applications II

7. Dielectric materials and compounds based on carbon

8. Scanning probe microscopy and their application

9. Electron microscopy and lithographic techniques

10. Methods based on ion detection (SIMS) and nuclear methods (RBS)

11. Applications in electronics and tissue engineering

Last update: Slepička Petr (27.05.2018)
Course completion requirements -

Oral exam.

Last update: Slepička Petr (27.05.2018)