Vlček Jan Ing. Ph.D.
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| E-Mail: | Jan.Vlcek@vscht.cz |
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| Faculty: | Faculty of Chemical Engineering |
| Department: | Department of Physics and Measurement (444) |
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| Courses |
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  Code | Title | Semester | Hours per week, examination | Department | Faculty | |
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P444008 | Physics of thin films and surfaces | both | 2/1, other [HT] | 444 | FCHI |
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M444014 | Metrology of Physical Quantities | summer | summer s.:2/3, C+Ex [HT] | 444 | FCHI |
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AP444010 | Optical and Electron Microscopy | both | 3/0, other [HT] | 444 | FCHI |
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M444011 | Optical and Electron Microscopy | winter | winter s.:1/2, MC [HT] | 444 | FCHI |
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P444010 | Optical and Electron Microscopy | both | 3/0, other [HT] | 444 | FCHI |
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AP444008 | Physics of thin films and surfaces | both | 2/1, other [HT] | 444 | FCHI |
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B444010 | Technology of Thin Layers and Sensors | winter | winter s.:3/1, C+Ex [HT] | 444 | FCHI |