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![]() ![]() | ![]() ![]() | Faculty | Department | Hours per week, examination | ![]() ![]() | 4EU+ | |
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AB444003 | Physics I | 22340 | 444 | summer s.:3/2, C+Ex [HT] | summer | no |
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AB444004 | Physics II | 22340 | 444 | winter s.:2/2, C+Ex [HT] | winter | no |
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AB444005 | Physics: Laboratory | 22340 | 444 | winter s.:0/4, MC [HT] | winter | no |
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AB444006 | Fundamentals of Machinery | 22340 | 444 | winter s.:2/1, C+Ex [HT] | winter | no |
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AM444007 | Measurement in Environmental Protection | 22340 | 444 | summer s.:2/1, Ex [HT] | summer | no |
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AP444001 | Circular Dichroism Spectroscopy | 22340 | 444 | 3/0, other [HT] | both | no |
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AP444003 | Plasma Physics | 22340 | 444 | 3/0, other [HT] | both | no |
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AP444004 | Chemical Sensors | 22340 | 444 | 3/0, other [HT] | both | no |
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AP444005 | Software Tools for Measurement and Control | 22340 | 444 | 3/0, other [HT] | both | no |
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AP444007 | Organic Electronics and Photonics | 22340 | 444 | 2/1, other [HT] | both | no |
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AP444008 | Physics of thin films and surfaces | 22340 | 444 | 2/1, other [HT] | both | no |
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AP444010 | Optical and Electron Microscopy | 22340 | 444 | 3/0, other [HT] | both | no |
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B444001 | Physics A | 22340 | 444 | 3/2, C+Ex [HT] | both | no |
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B444002 | Physics B | 22340 | 444 | 2/2, C+Ex [HT] | both | no |
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B444003 | Physics I | 22340 | 444 | 3/2, C+Ex [HT] | both | no |
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B444004 | Physics II | 22340 | 444 | 2/2, C+Ex [HT] | both | no |
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B444005 | Physics: Laboratory | 22340 | 444 | winter s.:0/4, MC [HT] | winter | no |
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B444006 | Fundamentals of Machinery | 22340 | 444 | 2/1, C+Ex [HT] | both | no |
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B444007 | Measuring and Control Engineering | 22340 | 444 | 2/1, Ex [HT] | both | no |
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B444008 | Fundamentals of Electronics | 22340 | 444 | summer s.:2/2, C+Ex [HT] | summer | no |
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B444009 | Measuring and Control Engineering: Laboratory | 22340 | 444 | summer s.:0/3, MC [HT] | summer | no |
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B444010 | Technology of Thin Layers and Sensors | 22340 | 444 | winter s.:3/1, C+Ex [HT] | winter | no |
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B444011 | Fundamentals of Physics | 22340 | 444 | winter s.:2/1, C+Ex [HT] | winter | no |
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B444012 | Biophysics | 22340 | 444 | winter s.:2/1, C+Ex [HT] | winter | no |
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B444043 | Computer data acquisition and virtual instrumentation | 22340 | 444 | winter s.:0/15, MC [HS] | winter | no |
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CZV444001 | Basics of physics for bachelors | 22340 | 444 | summer s.:4/0, Ex [HT] | summer | no |
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M444001 | Physic of Biosystems | 22340 | 444 | winter s.:2/1, Ex [HT] | winter | no |
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M444002 | Programming for Measurement and Control | 22340 | 444 | winter s.:1/2, MC [HT] | winter | no |
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M444003 | Physics III | 22340 | 444 | winter s.:2/1, C+Ex [HT] | winter | no |
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M444006 | Measuring Technique | 22340 | 444 | winter s.:2/3, Ex [HT] | winter | no |
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M444007 | Measurement in Environmental Protection | 22340 | 444 | winter s.:2/1, C+Ex [HT] | winter | no |
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M444008 | Sensors and Sensor Systems | 22340 | 444 | summer s.:2/2, C+Ex [HT] | summer | no |
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M444009 | Chemical Sensors | 22340 | 444 | winter s.:2/3, C+Ex [HT] | winter | no |
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M444010 | Thermography and thermodiagnostics | 22340 | 444 | winter s.:1/3, C+Ex [HT] | winter | no |
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M444011 | Optical and Electron Microscopy | 22340 | 444 | winter s.:1/2, MC [HT] | winter | no |
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M444012 | Electronic for Measuring Technique | 22340 | 444 | summer s.:2/2, C+Ex [HT] | summer | no |
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M444013 | Technology and Properties of Sensing Layers | 22340 | 444 | winter s.:3/1, C+Ex [HT] | winter | no |
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M444014 | Metrology of Physical Quantities | 22340 | 444 | summer s.:2/3, C+Ex [HT] | summer | no |
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M444015 | Physics of Plasma | 22340 | 444 | summer s.:2/1, C+Ex [HT] | summer | no |
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N444005 | Fundamentals of Machinery | 22340 | 444 | summer s.:2/1, C+Ex [HT] | summer | no |
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P444001 | Circular Dichroism Spectroscopy | 22340 | 444 | 3/0, other [HT] | both | no |
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P444003 | Plasma Physics | 22340 | 444 | 3/0, other [HT] | both | no |
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P444004 | Chemical Sensors | 22340 | 444 | 3/0, other [HT] | both | no |
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P444005 | Software Tools for Measurement and Control | 22340 | 444 | 3/0, other [HT] | both | no |
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P444007 | Organic Electronics and Photonics | 22340 | 444 | 2/1, other [HT] | both | no |
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P444008 | Physics of thin films and surfaces | 22340 | 444 | 2/1, other [HT] | both | no |
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P444010 | Optical and Electron Microscopy | 22340 | 444 | 3/0, other [HT] | both | no |