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This subject comprises the basic terms, related to the molecular structure analysis and surface analysis. It brings a survey of individual techniques and offered information. Techniques of the surface analysis and imaging, including the scanning probe (near-field) microanalysis, are the second key part of this survey. In some cases it is an extension of knowledge gained in the basic courses of Analytical chemistry I and II.
Last update: Kubová Petra (22.01.2018)
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It is compulsory to pass a written test and final oral examination. Last update: Matějka Pavel (21.02.2018)
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R:Modern Instrumental Analysis, ed. S. Ahuja, N. Jespersen, Comprehensive Analytical Chemistry Vol. 47 (2006), p. 1-864, ISBN: 978-0-444-52259-7, https://www.sciencedirect.com/science/handbooks/0166526X/47 (available online at VSCHT)
A:Non-Destructive Microanalysis of Cultural Heritage materials, ed. S. Ahuja, N. Jespersen, Comprehensive Analytical Chemistry Vol. 42 (2004), p. 1-800, ISBN: 978-0-444-50738-9, https://www.sciencedirect.com/science/handbooks/0166526X/42 (available online at VSCHT)
A:R.L. McCreery: Raman Spectroscopy for Chemical Analysis, Wiley 2000, Online ISBN: 9780471721642, http://onlinelibrary.wiley.com/book/10.1002/0471721646 (available online at VSCHT)
A:L. A. Casper, C. J. Powell: Industrial Applications of Surface Analysis, vol. 199, ACS 1982, eISBN: 9780841209411, https://pubs.acs.org/doi/book/10.1021/bk-1982-0199 (available online at VSCHT)
A:Sam Zhang, Lin Li, Ashok Kumar: Materials Characterization Techniques, CRC Press Boca Raton 2009, ISBN 978-1-4200-4294-8 Last update: Matějka Pavel (21.02.2018)
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1. Fundamental terms of structural and surface analysis 2. Surface analysis methods based on electron detection (XPS, UPS) 3. Surface analysis methods based on electron detection (Auger spectroscopy) 4. Methods of electron microscopy and chemical analysis (EDX, WDX) 5. Methods of scanning probe microscopy (AFM, STM, SNOM) 6. Surface analysis methods based on ion detection (SIMS) 7. Methods of X-ray diffraction 8. Electron and neutron diffraction 9. Techniques of infrared and Raman spectrometry 10. Infrared and Raman microspectrometry, mapping and imaging 11. Surface-enhanced vibrational spectroscopies 12. NMR spectroscopy and molecular structure 13. Solid-state NMR spectroscopy 14. NMR analysis in inhomogeneous fields, mobile NMR Last update: Matějka Pavel (21.02.2018)
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electronic materials - slides for lectures - http://www.vscht.cz/anl/matejka/#povrch Last update: Kubová Petra (22.01.2018)
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Students will be able to: Describe and explain the principles and instrumentation of following techniques: photoelectron spectroscopy, Auger spectroscopy, X-ray fluorescence analysis, electron microscopy, scanning probe microscopy, X-ray, electron and neutron diffraction, secondary ion mass spectrometry, infrared and Raman microspectrometry and NMR spectrometry/relaxometry focusing on solids. Know examples of practical applications of individual techniques of structural and surface analysis. Last update: Kubová Petra (22.01.2018)
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none Last update: Kubová Petra (22.01.2018)
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Teaching methods | ||||
Activity | Credits | Hours | ||
Konzultace s vyučujícími | 0.5 | 14 | ||
Účast na přednáškách | 1 | 28 | ||
Příprava na přednášky, semináře, laboratoře, exkurzi nebo praxi | 0.5 | 14 | ||
Příprava na zkoušku a její absolvování | 1 | 28 | ||
3 / 3 | 84 / 84 |
Coursework assessment | |
Form | Significance |
Regular attendance | 10 |
Examination test | 40 |
Oral examination | 50 |