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Spectroscopic and Microscopic Characterization of Materials - AM107017
Title:
Spectroscopic and Microscopic Characterization of Materials
Guaranteed by:
Department of Glass and Ceramics (107)
Faculty:
Faculty of Chemical Technology
Actual:
from 2019
Semester:
summer
Points:
summer s.:5
E-Credits:
summer s.:5
Examination process:
summer s.:
Hours per week, examination:
summer s.:3/0, Ex [HT]
Capacity:
unknown / unknown (unknown)
Min. number of students:
unlimited
State of the course:
taught
Language:
English
Teaching methods:
full-time
Teaching methods:
full-time
Level:
Note:
course can be enrolled in outside the study plan
Annotation -
--- Czech English
The course introduces the basic microscopic and spectroscopic methods used for materials characterization. The course covers energy levels of atoms, molecule, and solid, physical principles of methods and their relation to instruments and sample preparations.
Last update: Kubová Petra (14.01.2018)
The course introduces the basic microscopic and spectroscopic methods used for materials characterization. The course covers energy levels of atoms, molecule, and solid, physical principles of methods and their relation to instruments and sample preparations.
Last update: Kubová Petra (14.01.2018)
Aim of the course -
--- Czech English
Student will be able to
Describe energy levels of atom and solid
Propose a suitable microscopic or spectroscopic method for extracting a specific information of a material
Suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation
Last update: Kubová Petra (14.01.2018)
Student will be able to
Describe energy levels of atom and solid
Propose a suitable microscopic or spectroscopic method for extracting a specific information of a material
Suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation
Last update: Kubová Petra (14.01.2018)
Course completion requirements
Precondition for the oral part is 50% in the written part.
Last update: Gedeon Ondrej (28.02.2018)
Literature -
--- Czech English
Obligatory :
Concepts of modern physics , Beiser, Arthur, 1973
Materials characterization , Leng, Yang, 2008
Recommended :
Physical principles of electron microscopy, an introduction to TEM, SEM, and AEM , Egerton, R., 2005
Scanning Electron Microscopy , Reimer, Ludwig, 1998
Mass Spectrometry , de Hoffmann Edmond; Stroobant, Vincent, 2007
Last update: Gedeon Ondrej (06.08.2024)
Povinná :
Concepts of modern physics , Beiser, Arthur, 1973
Materials characterization , Leng, Yang, 2008
Doporučená :
Physical principles of electron microscopy, an introduction to TEM, SEM, and AEM , Egerton, R., 2005
Scanning Electron Microscopy , Reimer, Ludwig, 1998
Mass Spectrometry , de Hoffmann, Edmond; Stroobant, Vincent, 2007
Last update: Gedeon Ondrej (06.08.2024)
Syllabus -
--- Czech English
1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.
2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.
3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.
4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.
5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.
6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.
7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping.
X-ray fluorescence spectroscopy.
8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved
spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.
9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS
10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.
11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.
12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction,
powder diffraction.
13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.
14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole
mass analyser, time-of-flight analyser, other detectors and analysers.
Last update: Kubová Petra (14.01.2018)
1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.
2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.
3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.
4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.
5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.
6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.
7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping.
X-ray fluorescence spectroscopy.
8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved
spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.
9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS
10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.
11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.
12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction,
powder diffraction.
13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.
14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole
mass analyser, time-of-flight analyser, other detectors and analysers.
Last update: Gedeon Ondrej (20.02.2018)
Teaching methods
Activity
Credits
Hours
Účast na přednáškách
1.5
42
Příprava na zkoušku a její absolvování
3.5
98
5 / 5
140 / 140
