This course provides a general overview of the characterization methods for particle and particle systems. In the first the parameters describing size, shape and arrangement of small particles are defined, and the statistics of small particles is explained in great detail, including quantiles, mean values, moments and moment ratios. In the second part the different particle characterization techniques are considered, from sedimentation techniques to laser diffraction, image analysis, X-ray diffraction adsorption methods and less common techniques. The last part of this subject concerns disperse systems. The course is appropriate for students of all subjects and can be recommended to all those whose work requires the charactzerization of particle systems and microstructures.

Students will be able to:

correctly use all concepts related to particle size and shape,

correctly interpret size distributions,

use the correct terminology for the presentation of results and understand the theoretical fundamentals of common characterzation methods to the degree necessary to take full advantage of the current special literature in the field.

R - Allen T.: Particle Size Measurement (two volumes, fifth edition). Chapman & Hall, London 1997. (ISBN 0-412-75350-2).

R - van de Hulst H. C.: Light Scattering by Small Particles. Dover, New York 1981. (ISBN 0-486-64228-3).

R - Xu R.: Particle Characterization - Light Scattering Methods. Kluwer Academic Publishers, Dordrecht 2000. (ISBN 1-4020-3-0357-9).

R - Gregg S. J., Sing K. S. W.: Adsorption, Surface Area and Porosity (second edition). Academic Press, London 1982. (ISBN 0-12-300956-1).

R - Russ J. C., Dehoff R. T.: Practical Stereology (second edition). Kluwer Academic, New York 2000. (ISBN 0-306-46476-4).

1. Introduction (equivalent diameters)

2. Particle shape, particle surface and surface fractals

3. Particle packing, coordination numbers and mass fractals

4. Small particle statistics

5. Sedimentation methods

6. Laser diffraction I: Theory

7. Laser diffraction II: Practice

8. Other methods (electrozone sensing, dynamic light scattering)

9. Image analysis I: Free particles, quantitative shape determination

10. Image analysis II: Grains in polycrystalline materials, stereology

11. XRD grain size (Scherrer line broadening)

12. Adsorption methods (BET)

13. Aerosols

14. Suspensions and nanofluids

1. Introduction (equivalent diameters)

2. Particle shape, particle surface and surface fractals

3. Particle packing, coordination numbers and mass fractals

4. Small particle statistics

5. Sedimentation methods

6. Laser diffraction I: Theory

7. Laser diffraction II: Practice

8. Other methods (electrozone sensing, dynamic light scattering)

9. Image analysis I: Free particles, quantitative shape determination

10. Image analysis II: Grains in polycrystalline materials, stereology

11. XRD grain size (Scherrer line broadening)

12. Adsorption methods (BET)

13. Aerosols

14. Suspensions and nanofluids

Pabst W., Gregorová E.: Characterization of particles and particle systems. VŠCHT Praha 2007 (accesssible via

http://www.vscht.cz/sil/keramika/Characterization_of_particles/CPPS%20_English%20version_.pdf ).