SubjectsSubjects(version: 875)
Course, academic year 2019/2020
  
Spectroscopical Methods for Study of Solids - D107004
Title: Spektroskopické metody studia pevných látek
Guaranteed by: Department of Glass and Ceramics (107)
Actual: from 2015
Semester: both
Points: 0
E-Credits: 0
Examination process:
Hours per week, examination: 0/0 other [hours/week]
Capacity: winter:unknown / unknown (unknown)
summer:unknown / unknown (unknown)
Min. number of students: unlimited
Language: Czech
Teaching methods: full-time
Level:  
For type:  
Note: course is intended for doctoral students only
can be fulfilled in the future
you can enroll for the course in winter and in summer semester
Guarantor: Gedeon Ondrej prof. RNDr. Ph.D., DSc.
Z//Is interchangeable with: AP107002, P107002
Annotation -
Last update: VED107 (18.04.2014)
The course covers X-ray, electron, and ion spectroscopies, electron and tip microscopies, and detectors and analysers. The stress is put on principles and theoretical description of fundamental phenomena governing the spectroscopies and microscopies.
Aim of the course -
Last update: VED107 (18.04.2014)

Students will be able to:

Describe and explain physical phenomena on which the methods are based.

Propose a suitable microscopic or spectroscopic method for extracting a piece of specific information of a materiál.

Suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation.

Literature -
Last update: VED107 (18.04.2014)

R: A. Beiser, Úvod do moderní fyziky, Academia, 1975,104-21-852

R: Y. Leng, Materials characterization, Wiley, 2008,ISBN 978-0-470-82298-2

R: R.F. Egerton, Physical principles of electron microscopy, Springer, 2006, ISBN-13: 978-0387-25800-0

R: L. Eckertová, Metody analýzy povrchů, elektronová spektroskopie, Academia, 1990, ISBN 80-200-0261-8

A: Selected papers and web pages

Syllabus -
Last update: VED107 (18.04.2014)

Spectrum, cross section, properties of particles and radiation. Elastic and inelastic cross section, Compton scattering, photoelectric effect.

Physics of of atom, electron-electron and spin-orbital interactions, splitting of spectral lines. Electron and atom energy levels, selection rules, energy bands in solid, Bloch function, quantum tunnelling.

Transmission electron microscopy, principles, contrast, sample preparations.

Scanning electron microscopy, pronciples, backscattered and secondary electrons, sample preparations.

Electron microprobe analysis, principle of method, correction methods.

X-ray fluorescence spectroscopy.

8. Formation, structure, and properties, principles, correction methods.

Surface - creation, structure and properties. XPS and UV XPS, principle of the method, satellite lines, angle-resolved spectroscopy.

Auger spectroscopy, principles, Auger microscopy.

SIMS for solids, ion scattering, kinematic factor, sputtering yield, SNMS.

PIXE RBS and other ion spetroscopies, , low energy ion spectroscopy.

Probe microscopies and their principles. STM, AFM, and SNOM.

Diffraction of photons, electrons and neutrons. Structural factor. LEED, EBSD, XRD, and ND.

Vacuum and vacuum instruments. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole mass analyser, time-of-flight analyser.

Course completion requirements -
Last update: VED107 (18.04.2014)

Oral exam.

Coursework assessment
Form Significance
Oral examination 100

 
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