SubjectsSubjects(version: 875)
Course, academic year 2019/2020
  
Spectroscopic and Microscopic Methods for Characterisation of Materials - S107020
Title: Spectroscopic and Microscopic Methods for Characterisation of Materials
Guaranteed by: Department of Glass and Ceramics (107)
Actual: from 2019
Semester: summer
Points: summer s.:5
E-Credits: summer s.:5
Examination process: summer s.:
Hours per week, examination: summer s.:3/1 C+Ex [hours/week]
Capacity: unknown / unknown (unknown)
Min. number of students: unlimited
Language: English
Teaching methods: full-time
Level:  
Is provided by: AM107017
For type:  
Guarantor: Gedeon Ondrej prof. RNDr. Ph.D., DSc.
Annotation -
Last update: VED107 (20.01.2015)
The course introduces the basic microscopic and spectroscopic methods used for materials characterization. The course covers energy levels of atoms, molecule, and solid, physical principles of methods and their relation to instruments and sample preparations.
Aim of the course -
Last update: VED107 (20.01.2015)

Student will be able to

Describe energy levels of atom and solid

Propose a suitable microscopic or spectroscopic method for extracting a specific information of a material

Suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation

Literature -
Last update: VED107 (20.01.2015)

Z: Y. Leng, Materials characterization, Wiley, 2008.

Z: R.F. Egerton, Physical principles of electron microscopy, 2005.

Learning resources -
Last update: VED107 (20.01.2015)

Slides of the talks in the electronic form

Syllabus -
Last update: VED107 (20.01.2015)

1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.

2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.

3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.

4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.

5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.

6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.

7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping.

X-ray fluorescence spectroscopy.

8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved

spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.

9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS

10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.

11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.

12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction,

powder diffraction.

13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.

14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole

mass analyser, time-of-flight analyser, other detectors and analysers.

Registration requirements -
Last update: VED107 (20.01.2015)

Mathematics I, Physics I

Teaching methods
Activity Credits Hours
Účast na přednáškách 1,5 42
Příprava na přednášky, semináře, laboratoře, exkurzi nebo praxi 1 28
Příprava na zkoušku a její absolvování 2 56
Účast na seminářích 0,5 14
5 / 5 140 / 140
Coursework assessment
Form Significance
Examination test 80
Oral examination 20

 
VŠCHT Praha