| | | |  |
|  Code |  Title |  Semester | Taught: | Language of instruction: | Hours per week, examination | Department | Faculty | 4EU+ |
 |
AB444003 |
Physics I |
summer |
taught |
English |
summer s.:3/2, C+Ex [HT] |
444 |
22340 |
no |
 |
AB444004 |
Physics II |
winter |
taught |
English |
winter s.:2/2, C+Ex [HT] |
444 |
22340 |
no |
 |
AB444005 |
Physics: Laboratory |
winter |
taught |
English |
winter s.:0/4, MC [HT] |
444 |
22340 |
no |
 |
AB444006 |
Fundamentals of Machinery |
winter |
taught |
English |
winter s.:2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
AM444007 |
Measurement in Environmental Protection |
summer |
taught |
English |
summer s.:2/1, Ex [HT] |
444 |
22340 |
no |
 |
AP444001 |
Circular Dichroism Spectroscopy |
both |
taught |
English |
3/0, other [HT] |
444 |
22340 |
no |
 |
AP444003 |
Plasma Physics |
both |
taught |
English |
3/0, other [HT] |
444 |
22340 |
no |
 |
AP444004 |
Chemical Sensors |
both |
taught |
English |
3/0, other [HT] |
444 |
22340 |
no |
 |
AP444005 |
Software Tools for Measurement and Control |
both |
taught |
English |
3/0, other [HT] |
444 |
22340 |
no |
 |
AP444007 |
Organic Electronics and Photonics |
both |
taught |
English |
2/1, other [HT] |
444 |
22340 |
no |
 |
AP444008 |
Physics of thin films and surfaces |
both |
taught |
English |
2/1, other [HT] |
444 |
22340 |
no |
 |
AP444010 |
Optical and Electron Microscopy |
both |
taught |
English |
3/0, other [HT] |
444 |
22340 |
no |
 |
B444001 |
Physics A |
both |
taught |
Czech |
3/2, C+Ex [HT] |
444 |
22340 |
no |
 |
B444002 |
Physics B |
both |
taught |
Czech |
2/2, C+Ex [HT] |
444 |
22340 |
no |
 |
B444003 |
Physics I |
both |
taught |
Czech |
3/2, C+Ex [HT] |
444 |
22340 |
no |
 |
B444004 |
Physics II |
both |
taught |
Czech |
2/2, C+Ex [HT] |
444 |
22340 |
no |
 |
B444005 |
Physics: Laboratory |
winter |
taught |
Czech |
winter s.:0/4, MC [HT] |
444 |
22340 |
no |
 |
B444006 |
Fundamentals of Machinery |
both |
taught |
Czech |
2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
B444007 |
Measuring and Control Engineering |
both |
taught |
Czech |
2/1, Ex [HT] |
444 |
22340 |
no |
 |
B444008 |
Fundamentals of Electronics |
summer |
taught |
Czech |
summer s.:2/2, C+Ex [HT] |
444 |
22340 |
no |
 |
B444009 |
Measuring and Control Engineering: Laboratory |
summer |
taught |
Czech |
summer s.:0/3, MC [HT] |
444 |
22340 |
no |
 |
B444010 |
Technology of Thin Layers and Sensors |
winter |
taught |
Czech |
winter s.:3/1, C+Ex [HT] |
444 |
22340 |
no |
 |
B444011 |
Fundamentals of Physics |
winter |
taught |
Czech |
winter s.:2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
B444012 |
Biophysics |
winter |
taught |
Czech |
winter s.:2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
B444013 |
Physical Limits of Sustainable Chemistry |
winter |
taught |
Czech |
winter s.:2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
B444014 |
CAD Systems for Mechanical Engineering and 3D Printing |
winter |
taught |
Czech |
winter s.:1/2, C+Ex [HT] |
444 |
22340 |
no |
 |
B444043 |
Computer data acquisition and virtual instrumentation |
winter |
taught |
Czech |
winter s.:0/15, MC [HS] |
444 |
22340 |
no |
 |
CZV444001 |
Basics of physics for bachelors |
summer |
taught |
Czech |
summer s.:4/0, Ex [HT] |
444 |
22340 |
no |
 |
M444001 |
Physic of Biosystems |
winter |
taught |
Czech |
winter s.:2/1, Ex [HT] |
444 |
22340 |
no |
 |
M444002 |
Programming for Measurement and Control |
winter |
taught |
Czech |
winter s.:1/2, MC [HT] |
444 |
22340 |
no |
 |
M444003 |
Physics III |
winter |
taught |
Czech |
winter s.:2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
M444006 |
Measuring Technique |
winter |
taught |
Czech |
winter s.:2/3, Ex [HT] |
444 |
22340 |
no |
 |
M444007 |
Measurement in Environmental Protection |
winter |
taught |
Czech |
winter s.:2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
M444008 |
Sensors and Sensor Systems |
summer |
taught |
Czech |
summer s.:2/2, C+Ex [HT] |
444 |
22340 |
no |
 |
M444009 |
Chemical Sensors |
winter |
taught |
Czech |
winter s.:2/3, C+Ex [HT] |
444 |
22340 |
no |
 |
M444010 |
Thermography and thermodiagnostics |
winter |
taught |
Czech |
winter s.:1/3, C+Ex [HT] |
444 |
22340 |
no |
 |
M444011 |
Optical and Electron Microscopy |
winter |
taught |
Czech |
winter s.:1/2, MC [HT] |
444 |
22340 |
no |
 |
M444012 |
Electronic for Measuring Technique |
summer |
taught |
Czech |
summer s.:2/2, C+Ex [HT] |
444 |
22340 |
no |
 |
M444013 |
Technology and Properties of Sensing Layers |
winter |
taught |
Czech |
winter s.:3/1, C+Ex [HT] |
444 |
22340 |
no |
 |
M444014 |
Metrology of Physical Quantities |
summer |
taught |
Czech |
summer s.:2/3, C+Ex [HT] |
444 |
22340 |
no |
 |
M444015 |
Physics of Plasma |
summer |
taught |
Czech |
summer s.:2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
N444005 |
Fundamentals of Machinery |
summer |
taught |
Czech |
summer s.:2/1, C+Ex [HT] |
444 |
22340 |
no |
 |
P444001 |
Circular Dichroism Spectroscopy |
both |
taught |
Czech |
3/0, other [HT] |
444 |
22340 |
no |
 |
P444003 |
Plasma Physics |
both |
taught |
Czech |
3/0, other [HT] |
444 |
22340 |
no |
 |
P444004 |
Chemical Sensors |
both |
taught |
Czech |
3/0, other [HT] |
444 |
22340 |
no |
 |
P444005 |
Software Tools for Measurement and Control |
both |
taught |
Czech |
3/0, other [HT] |
444 |
22340 |
no |
 |
P444007 |
Organic Electronics and Photonics |
both |
taught |
Czech |
2/1, other [HT] |
444 |
22340 |
no |
 |
P444008 |
Physics of thin films and surfaces |
both |
taught |
Czech |
2/1, other [HT] |
444 |
22340 |
no |
 |
P444010 |
Optical and Electron Microscopy |
both |
taught |
Czech |
3/0, other [HT] |
444 |
22340 |
no |
|