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Last update: Vlček Jan Ing. Ph.D. (28.11.2018)
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Last update: Vlček Jan Ing. Ph.D. (28.11.2018)
Students will be able to:
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Last update: Vlček Jan Ing. Ph.D. (30.08.2019)
Z: Jerome Mertz, Introduction to Optical Microscopy, Cambridge University Press, 2019, ISBN: 1108428304 Z: Ludwig Reimer, Helmut Kohl, Transmission Electron Microscopy: Physics of Image Formation, Springer, 2008, ISBN: 0387347585 Z: Ludwig Reimer, Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, Springer, 1998, ISBN: 3540639764 Z: Kubínek R., Šafářová K., Vůjtek M., Elektronová mikroskopie, Univerzita Palackého v Olomouci - skripta, 2011, ISBN: 978-80-244-2739-3 Z: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM, R.F. Egerton, Springer Science & Business Media, 2006, ISBN 0387260161, 9780387260167 Z: Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Scanning Electron Microscopy and X-Ray Microanalysis, Springer, 2017, ISBN 1493966766, 9781493966769 Z: David B. Williams, C. Barry Carter, Transmission Electron Microscopy: A Textbook for Materials Science, Springer Science & Business Media, 2009, ISBN 038776500X, 9780387765006 Z: Peter Török, Fu-Jen Kao,Optical Imaging and Microscopy: Techniques and Advanced Systems, Springer, 2013, ISBN 3540460225, 9783540460220 Z: Raymond Haynes, Optical Microscopy of Materials, Springer Science & Business Media, 2013, ISBN 147576085X, 9781475760859 |
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Last update: Vlček Jan Ing. Ph.D. (28.11.2018)
Available at course webpages:
https://ufmt.vscht.cz/index.php/en/electronic-aids |
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Last update: Vrňata Martin prof. Dr. Ing. (23.04.2020)
1. Introduction - basic microscopic techniques 2. Limits of microscopic techniques 3. Construction parameters of microscopes - I. Optical 4. Construction parameters of microscopes - II. Confocal 5. Detectors and sources of radiation in microscopy - I. 6. Electron microscopy - interactions of electrons, sources of electrons 7. Vacuum technique for elelctron microscopy 8. Construction parameters of microscopes - III. Electron scanning 9. Detectors and sources of radiation in microscopy - II. 10. EDX and WDX detectors and elemental analysis 11. Accessories for SEM microscopy - focused ion beams, manipulators 12. Preparation of samples for electron microscopy - I. 13. Construction parameters of microscopes - IV. Electron transmission 14. Preparation of samples for electron microscopy - II.
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Last update: Vlček Jan Ing. Ph.D. (28.11.2018)
N/A |
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Last update: Vlček Jan Ing. Ph.D. (28.11.2018)
N/A |
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Last update: Vlček Jan Ing. Ph.D. (28.11.2018)
Oral exam |