SubjectsSubjects(version: 955)
Course, academic year 2019/2020
Spectroscopic and Microscopic Characterization of Materials - M107017
Title: Spektroskopická a mikroskopická charakterizace materiálů
Guaranteed by: Department of Glass and Ceramics (107)
Faculty: Faculty of Chemical Technology
Actual: from 2019 to 2019
Semester: winter
Points: winter s.:5
E-Credits: winter s.:5
Examination process: winter s.:
Hours per week, examination: winter s.:3/0, Ex [HT]
Capacity: unknown / unknown (unknown)
Min. number of students: unlimited
State of the course: not taught
Language: Czech
Teaching methods: full-time
Teaching methods: full-time
Note: course can be enrolled in outside the study plan
enabled for web enrollment
Guarantor: Gedeon Ondrej prof. RNDr. Ph.D., DSc.
Interchangeability : N107004
Examination dates   Schedule   
Annotation -
The course introduces the basic spectroscopic and microscopic methods used for characterization of materials. The focus is put on building of a proper model of materials, physical principles, and the interconnection of the methods with instrumentation.
Last update: Gedeon Ondrej (11.01.2018)
Aim of the course -

Students will be able to:

Describe energy levels of an atom and solid

Propose a suitable microscopic or spectroscopic method for extracting a specific information from material

Suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation

Last update: Gedeon Ondrej (11.01.2018)
Literature -

R: A. Beiser, Concepts of Modern Physics, The MCGraww Hill, 2003, ISBN 0-07-244848-2

R: Y. Leng, Materials characterization, Wiley, 2008,ISBN 978-0-470-82298-2

A: R.F. Egerton, Physical principles of electron microscopy, Springer, 2006, ISBN-13: 978-0387-25800-0

A: L. Reimer, Scanning Electron Microscopy, Springer, 1998, ISBN 3-540-63974-4

A: E. de Hoffmann, V. Stroobant, Mass Spectrometry, Wiley, 2007, ISBN 978-0-470-03311-1

Last update: Gedeon Ondrej (11.01.2018)
Syllabus -

1. Spectroscopic and microscopic methods, classification. Spectrum and its origin, spectrum constituents.

2. Cross section, examles of cross sections. Properties of particles and radiation.

3. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.

4. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparation.

5. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparation.

6. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping.

7. X-ray fluorescence spectroscopy. Absorption spectroscopies, EXAFS, XANES, EELS.

8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.

9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS.

10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.

11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.

12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction, powder diffraction.

13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.

14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole mass analyser, time-of-flight analyser, other detectors and analysers.

Last update: Gedeon Ondrej (09.01.2018)
Registration requirements -
Last update: Gedeon Ondrej (11.01.2018)
Course completion requirements -

Successful completion of written and oral parts of the exam.

Last update: Gedeon Ondrej (14.02.2018)
Teaching methods
Activity Credits Hours
Účast na přednáškách 1.5 42
Příprava na zkoušku a její absolvování 3.5 98
5 / 5 140 / 140
Coursework assessment
Form Significance
Examination test 80
Oral examination 20