SubjectsSubjects(version: 955)
Course, academic year 2019/2020
Spectroscopic and Microscopic Methods for Characterization of Materials - N107004
Title: Metody charakterizace látek
Guaranteed by: Department of Glass and Ceramics (107)
Faculty: Faculty of Chemical Technology
Actual: from 2014 to 2020
Semester: summer
Points: summer s.:5
E-Credits: summer s.:5
Examination process: summer s.:
Hours per week, examination: summer s.:3/1, C+Ex [HT]
Capacity: 60 / 60 (unknown)
Min. number of students: unlimited
State of the course: taught
Language: Czech
Teaching methods: full-time
Teaching methods: full-time
Guarantor: Gedeon Ondrej prof. RNDr. Ph.D., DSc.
Is interchangeable with: M107017
Examination dates   Schedule   
Annotation -
The course introduces the basic microscopic and spectroscopic methods used for characterization of materials. The course introduces energy levels of atom, molecule, and solid, covers physical principles of methods and their relation to instruments and sample preparations.
Last update: Gedeon Ondrej (05.08.2013)
Aim of the course -

Students will be able to:

Describe energy levels of atom and solid

Propose a suitable microscopic or spectroscopic method for extracting a specific information of a material

Suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation

Last update: VED107 (06.08.2013)
Literature -

R: Y. Leng, Materials characterization, Wiley, 2008,ISBN 978-0-470-82298-2

A: R.F. Egerton, Physical principles of electron microscopy, Springer, 2006, ISBN-13: 978-0387-25800-0

Last update: TAJ107 (05.02.2015)
Learning resources -

Slides of the talks in the electronic form

Last update: Gedeon Ondrej (05.08.2013)
Syllabus -

1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.

2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.

3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.

4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.

5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.

6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.

7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping. X-ray fluorescence spectroscopy.

8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.

9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS.

10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.

11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.

12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction, powder diffraction.

13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.

14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole mass analyser, time-of-flight analyser, other detectors and analysers.

Last update: VED107 (06.08.2013)
Registration requirements -

Mathematics II

Physics I

Last update: VED107 (06.08.2013)
Teaching methods
Activity Credits Hours
Účast na přednáškách 1.5 42
Příprava na přednášky, semináře, laboratoře, exkurzi nebo praxi 1 28
Příprava na zkoušku a její absolvování 2 56
Účast na seminářích 0.5 14
5 / 5 140 / 140
Coursework assessment
Form Significance
Examination test 80
Oral examination 20