Vlček Jan Ing. Ph.D.
| Faculty: | Faculty of Chemical Engineering |
|---|---|
| Department: | Department of Physics and Measurement (444) |
| Courses |
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![]() Code | ![]() Title | ![]() Semester | Taught: | Language of instruction: | Hours per week, examination | Department | Faculty | 4EU+ | |
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P444008 | Physics of thin films and surfaces | both | taught | Czech | 2/1, other [HT] | 444 | FCHI | no |
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M444014 | Metrology of Physical Quantities | summer | taught | Czech | summer s.:2/3, C+Ex [HT] | 444 | FCHI | no |
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AP444010 | Optical and Electron Microscopy | both | taught | English | 3/0, other [HT] | 444 | FCHI | no |
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M444011 | Optical and Electron Microscopy | winter | taught | Czech | winter s.:1/2, MC [HT] | 444 | FCHI | no |
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P444010 | Optical and Electron Microscopy | both | taught | Czech | 3/0, other [HT] | 444 | FCHI | no |
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AP444008 | Physics of thin films and surfaces | both | taught | English | 2/1, other [HT] | 444 | FCHI | no |
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B444010 | Technology of Thin Layers and Sensors | winter | taught | Czech | winter s.:3/1, C+Ex [HT] | 444 | FCHI | no |



