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This subject comprises the basic terms, related to the molecular structure analysis and surface analysis. It brings a survey of individual techniques and offered information. Techniques of the surface analysis and imaging, including the scanning probe (near-field) microanalysis, are the second key part of this survey. In some cases it is an extension of knowledge gained in the basic courses of Analytical chemistry I and II. Poslední úprava: VED402 (18.09.2013)
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Students will be able to:
Describe and explain the principles and instrumentation of following techniques: photoelectron spectroscopy, Auger spectroscopy, X-ray fluorescence analysis, electron microscopy, scanning probe microscopy, X-ray, electron and neutron diffraction, secondary ion mass spectrometry, infrared and Raman microspectrometry and NMR spectrometry/relaxometry focusing on solids.
Know examples of practical applications of individual techniques of structural and surface analysis. Poslední úprava: VED402 (18.09.2013)
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Z:Modern Instrumental Analysis, ed. S. Ahuja, N. Jespersen, Comprehensive Analytical Chemistry Vol. 47 (2006), p. 1-864 (available online at VSCHT)
Z:Non-Destructive Microanalysis of Cultural Heritage materials, ed. S. Ahuja, N. Jespersen, Comprehensive Analytical Chemistry Vol. 42 (2004), p. 1-800 (available online at VSCHT)
D:R.L. McCreery: Raman Spectroscopy for Chemical Analysis, Wiley 2000 (available online at VSCHT)
D:L. A. Casper, C. J. Powell: Industrial Applications of Surface Analysis, vol. 199, ACS 1982 (available online at VSCHT)
D:Sam Zhang, Lin Li, Ashok Kumar: Materials Characterization Techniques, CRC Press Boca Raton 2009, ISBN 978-1-4200-4294-8 Poslední úprava: VED402 (18.09.2013)
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1. Fundamental terms 2. Structure and geometry of molecules 3. Symmetry, point groups 4. Linear and circular polarized electromagnetic radiation, chirooptical methods 5. Infrared and Raman spectroscopy 6. Microwave spectroscopy 7. NMR spectrometry 8. Mass spectrometry 9. Crystal structure 10. X-ray and electron diffraction 11. Surface analysis methods based on electron detection 12. Surface analysis methods based on ion detection 13. Surface analysis methods based on photon detection 14. Scanning microscopy methods Poslední úprava: KNOBLOCL (13.03.2012)
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electronic materials - slides for lectures - http://www.vscht.cz/anl/matejka/#povrch Poslední úprava: VED402 (18.09.2013)
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None. Poslední úprava: VED402 (18.09.2013)
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