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Spectroscopic and Microscopic Characterization of Materials - AM107017
Anglický název:
Spectroscopic and Microscopic Characterization of Materials
Zajišťuje:
Ústav skla a keramiky (107)
Fakulta:
Fakulta chemické technologie
Platnost:
od 2019
Semestr:
letní
Body:
letní s.:5
E-Kredity:
letní s.:5
Způsob provedení zkoušky:
letní s.:
Rozsah, examinace:
letní s.:3/0, Zk [HT]
Počet míst:
neurčen / neurčen (neurčen)
Minimální obsazenost:
neomezen
Stav předmětu:
vyučován
Jazyk výuky:
angličtina
Způsob výuky:
prezenční
Způsob výuky:
prezenční
Úroveň:
Poznámka:
předmět je možno zapsat mimo plán povolen pro zápis po webu
Anotace -
--- čeština angličtina
The course introduces the basic microscopic and spectroscopic methods used for materials characterization. The course covers energy levels of atoms, molecule, and solid, physical principles of methods and their relation to instruments and sample preparations.
Poslední úprava: Kubová Petra (14.01.2018)
The course introduces the basic microscopic and spectroscopic methods used for materials characterization. The course covers energy levels of atoms, molecule, and solid, physical principles of methods and their relation to instruments and sample preparations.
Poslední úprava: Kubová Petra (14.01.2018)
Výstupy studia předmětu -
--- čeština angličtina
Student will be able to
Describe energy levels of atom and solid
Propose a suitable microscopic or spectroscopic method for extracting a specific information of a material
Suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation
Poslední úprava: Kubová Petra (14.01.2018)
Student will be able to
Describe energy levels of atom and solid
Propose a suitable microscopic or spectroscopic method for extracting a specific information of a material
Suggest proper analytical conditions, i.e. detector, analyser, primary source, sample preparation
Poslední úprava: Kubová Petra (14.01.2018)
Podmínky zakončení předmětu (Další požadavky na studenta) - angličtina
Precondition for the oral part is 50% in the written part.
Poslední úprava: Gedeon Ondrej (28.02.2018)
Literatura -
--- čeština angličtina
Povinná :
Concepts of modern physics , Beiser, Arthur, 1973
Materials characterization , Leng, Yang, 2008
Doporučená :
Physical principles of electron microscopy, an introduction to TEM, SEM, and AEM , Egerton, R., 2005
Scanning Electron Microscopy , Reimer, Ludwig, 1998
Mass Spectrometry , de Hoffmann, Edmond; Stroobant, Vincent, 2007
Poslední úprava: Gedeon Ondrej (06.08.2024)
Obligatory :
Concepts of modern physics , Beiser, Arthur, 1973
Materials characterization , Leng, Yang, 2008
Recommended :
Physical principles of electron microscopy, an introduction to TEM, SEM, and AEM , Egerton, R., 2005
Scanning Electron Microscopy , Reimer, Ludwig, 1998
Mass Spectrometry , de Hoffmann Edmond; Stroobant, Vincent, 2007
Poslední úprava: Gedeon Ondrej (06.08.2024)
Sylabus -
--- čeština angličtina
1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.
2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.
3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.
4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.
5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.
6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.
7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping.
X-ray fluorescence spectroscopy.
8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved
spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.
9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS
10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.
11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.
12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction,
powder diffraction.
13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.
14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole
mass analyser, time-of-flight analyser, other detectors and analysers.
Poslední úprava: Gedeon Ondrej (20.02.2018)
1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.
2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.
3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.
4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.
5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.
6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.
7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping.
X-ray fluorescence spectroscopy.
8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved
spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.
9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS
10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.
11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.
12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction,
powder diffraction.
13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.
14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole
mass analyser, time-of-flight analyser, other detectors and analysers.
Poslední úprava: Kubová Petra (14.01.2018)
Zátěž studenta
Činnost
Kredity
Hodiny
Účast na přednáškách
1.5
42
Příprava na zkoušku a její absolvování
3.5
98
5 / 5
140 / 140